A semi-empirical derivation of thin-film sensitivities for EDXRF spectrometers
Robert B. KelloggVolume:
28
Year:
1999
Language:
english
Pages:
4
DOI:
10.1002/(sici)1097-4539(199909/10)28:53.0.co;2-q
File:
PDF, 60 KB
english, 1999