X-Ray photoelectron spectroscopy study of CdTe oxide films...

Surface and Coatings Technology 2002 Vol. 155; Iss. 1

X-Ray photoelectron spectroscopy study of CdTe oxide films grown by rf sputtering with an Ar–NH3 plasma

P. Bartolo-Pérez, R. Castro-Rodrı́guez, F. Caballero-Briones, W. Cauich, J.L. Peña, M.H. Farias
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Volume:
155
Year:
2002
Language:
english
Pages:
5
DOI:
10.1016/s0257-8972(02)00028-2
File:
PDF, 148 KB
english, 2002
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