[IEEE 2015 19th International Symposium on VLSI Design and Test (VDAT) - Ahmedabad, India (2015.6.26-2015.6.29)] 2015 19th International Symposium on VLSI Design and Test - Power aware cache miss reduction by energy efficient victim retention
Chakraborty, Shounak, Das, Shirshendu, Kapoor, Hemangee K.Year:
2015
Language:
english
DOI:
10.1109/ISVDAT.2015.7208078
File:
PDF, 597 KB
english, 2015