[IEEE 2010 International Semiconductor Conference (CAS 2010) - Sinaia (2010.10.11-2010.10.13)] CAS 2010 Proceedings (International Semiconductor Conference) - Multiwall carbon-nanotube interconnects: radial effects on physical models and resistance calculations for various metal substrates
Bellucci, S, Onorato, P, Shunin, Y N, Zhukovskii, Y F, Burlutskaya, NYear:
2010
Language:
english
DOI:
10.1109/SMICND.2010.5650939
File:
PDF, 653 KB
english, 2010