SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China...

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SPIE Proceedings [SPIE Photonics Asia 2007 - Beijing, China (Sunday 11 November 2007)] Optical Design and Testing III - The effect of beam incident angles on cube corner retro-reflector measuring accuracy

Ouyang, Jianfei, Liu, Wanli, Qu, Xinghua, Yan, Yonggang, Wang, Yongtian, Tschudi, Theo T., Rolland, Jannick P., Tatsuno, Kimio
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Volume:
6834
Year:
2007
Language:
english
DOI:
10.1117/12.756069
File:
PDF, 340 KB
english, 2007
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