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SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 12 April 2010)] Optical Micro- and Nanometrology III - CCD-ARS set-up: a comprehensive and fast high-sensitivity characterisation tool for optical components

Zerrad, Myriam, Lequime, Michel, Deumié, Carole, Amra, Claude, Gorecki, Christophe, Asundi, Anand K., Osten, Wolfgang
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Volume:
7718
Year:
2010
Language:
english
DOI:
10.1117/12.854059
File:
PDF, 1.78 MB
english, 2010
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