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Computer simulation of thin film growth with defect formation
Y. Kaneko, Y. Hiwatari, K. Ohara, T. MurakamiVolume:
169-170
Year:
2003
Language:
english
Pages:
4
DOI:
10.1016/s0257-8972(03)00082-3
File:
PDF, 358 KB
english, 2003