Atomic-Scale Defects in Silicon Carbide for Quantum Sensing...

Materials Science Forum 2015 / 6 Vol. 821-823

Atomic-Scale Defects in Silicon Carbide for Quantum Sensing Applications

Dyakonov, Vladimir, Kraus, Hannes, Soltamov, V.A., Fuchs, Franziska, Simin, Dmitrij, Vaeth, Stefan, Sperlich, Andreas, Baranov, Pavel, Astakhov, G.
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Volume:
821-823
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.821-823.355
Date:
June, 2015
File:
PDF, 351 KB
english, 2015
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