A Study of Post Annealing Effects in the Repair of High Resistance Failures with Unstable Schottky Barrier Height in 4H-SiC Schottky Barrier Diode
Kyoung, Sin Su, Jung, Eun Sik, Kang, Tai Young, Yang, Chang Heon, Sung, Man YoungVolume:
821-823
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.821-823.588
Date:
June, 2015
File:
PDF, 522 KB
english, 2015