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Influence of Trench Structure on Reverse Characteristics of 4H-SiC JBS Diodes
Konishi, Kumiko, Kameshiro, Norifumi, Yokoyama, Natsuki, Shima, Akio, Shimamoto, YasuhiroVolume:
821-823
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.821-823.596
Date:
June, 2015
File:
PDF, 1.36 MB
english, 2015