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[IEEE 2015 China Semiconductor Technology International Conference (CSTIC) - Shanghai, China (2015.3.15-2015.3.16)] 2015 China Semiconductor Technology International Conference - An investigation of CeO2 based ReRAM with p+ and n+-Si bottom electrodes
Jin, J., Kakushima, K., Kataoka, Y., Nishiyama, A., Sugii, N., Wakabayashi, H., Tsutsui, K., Natori, K., Iwai, H.Year:
2015
Language:
english
DOI:
10.1109/cstic.2015.7153330
File:
PDF, 780 KB
english, 2015