Diffraction pattern indexing and the effect of metal ion implantation on ϰ-alumina
Authony J. Perry, Daniel E. Geist, Albert F. Tian, James R. Treglio, Krishnan NarasimhanVolume:
89
Year:
1997
Language:
english
Pages:
8
DOI:
10.1016/s0257-8972(96)03090-3
File:
PDF, 822 KB
english, 1997