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Extended x-ray absorption fine structure measurements on asymmetric bipolar pulse direct current magnetron sputtered Ta_2O_5 thin films
Maidul Haque, S., Sagdeo, Pankaj R., Shinde, D. D., Misal, J. S., Jha, S. N., Bhattacharyya, D., Sahoo, N. K.Volume:
54
Language:
english
Journal:
Applied Optics
DOI:
10.1364/ao.54.006744
Date:
August, 2015
File:
PDF, 751 KB
english, 2015