SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology 2015 - Beijing, China (Sunday 17 May 2015)] 2015 International Conference on Optical Instruments and Technology: Micro/Nano Photonics and Fabrication - Analysis on morphological and structural features of graphene layers by using polarization indirect microscopic imaging system
Zhou, Zhiping, Zhou, Changhe, Cheben, Pavel, Liu, Guoyan, Gao, Kun, Ni, Guoqiang, Liu, XuefengVolume:
9624
Year:
2015
Language:
english
DOI:
10.1117/12.2195263
File:
PDF, 396 KB
english, 2015