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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 10 August 2008)] Optical System Contamination: Effects, Measurements, and Control 2008 - Data reduction of BSDF measurements from curved surfaces
Fest, Eric C., Straka, Sharon A.Volume:
7069
Year:
2008
Language:
english
DOI:
10.1117/12.792570
File:
PDF, 278 KB
english, 2008