Measurement of Solute Profiles by Means of Synchrotron...

Materials Science Forum 2010 / 5 Vol. 649

Measurement of Solute Profiles by Means of Synchrotron X-Ray Radiography during Directional Solidification of Al-4 wt% Cu Alloys

Buffet, Adeline, Nguyen-Thi, Henri, Bogno, Aziz, Schenk, Thomas, Mangelinck-Noël, Nathalie, Reinhart, Guillaume, Bergeon, Nathalie, Billia, Bernard, Baruchel, J.
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Volume:
649
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.649.331
Date:
May, 2010
File:
PDF, 2.24 MB
english, 2010
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