Use of microscopic XRF for non-destructive analysis in art and archaeometry
K. Janssens, G. Vittiglio, I. Deraedt, A. Aerts, B. Vekemans, L. Vincze, F. Wei, I. De Ryck, O. Schalm, F. Adams, A. Rindby, A. Knöchel, A. Simionovici, A. SnigirevVolume:
29
Year:
2000
Language:
english
Pages:
19
DOI:
10.1002/(sici)1097-4539(200001/02)29:13.0.co;2-m
File:
PDF, 2.98 MB
english, 2000