[IEEE 2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol, Russia (2015.6.29-2015.7.3)] 2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices - Sharpness assessment of images obtained with a laser monitor
Chertikhina, Daria S., Trigub, Maxim V., Evtushneko, Tatiana G.Year:
2015
Language:
english
DOI:
10.1109/EDM.2015.7184559
File:
PDF, 482 KB
english, 2015