[IEEE 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Hong Kong, China (2015.5.10-2015.5.14)] 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Investigation of HCI reliability in interdigitated LDMOS
Cho, Kyuheon, Ko, Seonghoon, Machida, Fumie, Kim, Jaeho, Jang, Jaejune, Kwon, Uihui, Lee, Keun-Ho, Park, YoungkwanYear:
2015
Language:
english
DOI:
10.1109/ISPSD.2015.7123391
File:
PDF, 498 KB
english, 2015