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[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA, USA (2015.4.27-2015.4.29)] 2015 IEEE 33rd VLSI Test Symposium (VTS) - 3D microelectronic with BEOL compatible devices
Drouin, D, A-Bounouar, M, Droulers, G, Labalette, M, Pioro-Ladriere, M, Souifi, A, Ecoffey, SYear:
2015
Language:
english
DOI:
10.1109/VTS.2015.7116262
File:
PDF, 122 KB
english, 2015