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SPIE Proceedings [SPIE Industrial Lasers and Inspection (EUROPTO Series) - Munich, Germany (Monday 14 June 1999)] Terahertz Spectroscopy and Applications II - Spectroscopy with electronic terahertz techniques
van der Weide, Daniel W., Murakowski, Janusz A., Keilmann, Fritz, Chamberlain, J. MartynVolume:
3828
Year:
1999
Language:
english
DOI:
10.1117/12.361046
File:
PDF, 435 KB
english, 1999