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SPIE Proceedings [SPIE SPIE Europe Optics + Optoelectronics - Prague, Czech Republic (Monday 20 April 2009)] Damage to VUV, EUV, and X-Ray Optics II - Radiation hardness of AlxGa1-xN photodetectors exposed to Extreme UltraViolet (EUV) light beam
Malinowski, Pawel E., John, Joachim, Barkusky, Frank, Duboz, Jean Yves, Lorenz, Anne, Cheng, Kai, Derluyn, Joff, Germain, Marianne, De Moor, Piet, Minoglou, Kyriaki, Bayer, Armin, Mann, Klaus, HochedeVolume:
7361
Year:
2009
Language:
english
DOI:
10.1117/12.820691
File:
PDF, 647 KB
english, 2009