Influence of ion induced surface defects on the nucleation and formation mechanisms of metallic thin films
H.-A. Durand, K. Sekine, K. Etoh, K. Ito, I. KataokaVolume:
125
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s0257-8972(99)00610-6
File:
PDF, 417 KB
english, 2000