Determination of resputtering yields in carbon nitride...

Determination of resputtering yields in carbon nitride films grown by dual ion beam sputtering

C. Quirós, P. Prieto, E. Elizalde, R. Pérez-Casero, V. Gómez, P. Herrero, J.M. Sanz
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Volume:
125
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s0257-8972(99)00618-0
File:
PDF, 121 KB
english, 2000
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