[IEEE 2015 International Conference on IC Design & Technology (ICICDT) - Leuven, Belgium (2015.6.1-2015.6.3)] 2015 International Conference on IC Design & Technology (ICICDT) - FinFET stressor efficiency on alternative wafer and channel orientations for the 14 nm node and below
Eneman, G., De Keersgieter, A., Mocuta, A., Collaert, N., Thean, A.Year:
2015
Language:
english
DOI:
10.1109/ICICDT.2015.7165898
File:
PDF, 546 KB
english, 2015