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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Optics for EUV, X-Ray, and Gamma-Ray Astronomy VI - Stray light baffling and environmental qualification of silicon pore optics
Wille, Eric, Bavdaz, Marcos, Fransen, Sebastiaan, Collon, Maximilien, Ackermann, Marcelo, Guenther, Ramses, Vacanti, Giuseppe, van Baren, Coen, Haneveld, Jeroen, Olde Riekerink, Mark, Koelewijn, ArendVolume:
8861
Year:
2013
Language:
english
DOI:
10.1117/12.2024064
File:
PDF, 895 KB
english, 2013