SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Process Imaging for Automatic Control - Photon type selection in contrasted scattering media
Podgaetsky, Vitaly M., Tereshchenko, Sergei A., Smirnov, Alexander V., Tomilova, Larisa G., Vorobiev, Nikolai S., McCann, Hugh, Scott, David M.Volume:
4188
Year:
2001
Language:
english
DOI:
10.1117/12.417162
File:
PDF, 182 KB
english, 2001