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[IEEE ESSDERC 2014 - 44th European Solid State Device Research Conference - Venice Lido, Italy (2014.9.22-2014.9.26)] 2014 44th European Solid State Device Research Conference (ESSDERC) - Variability in device degradations: Statistical observation of NBTI for 3996 transistors
Awano, Hiromitsu, Hiromoto, Masayuki, Sato, TakashiYear:
2014
Language:
english
DOI:
10.1109/ESSDERC.2014.6948799
File:
PDF, 4.06 MB
english, 2014