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[IEEE 2015 International Symposium on Next-Generation Electronics (ISNE) - Taipei, Taiwan (2015.5.4-2015.5.6)] 2015 International Symposium on Next-Generation Electronics (ISNE) - A gate-oxide-breakdown antifuse OTP ROM array based on TSMC 90nm process
Liu, Zicheng, Zheng, Ruifeng, Sun, JianweiYear:
2015
Language:
english
DOI:
10.1109/ISNE.2015.7132015
File:
PDF, 286 KB
english, 2015