SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Optical Measurement Systems for Industrial Inspection IX - Phase disturbing speckle-suppressing method in fiber metrology under coherent illumination
Lehmann, Peter, Osten, Wolfgang, Albertazzi Gonçalves, Armando, Sun, Weimin, Yan, Yunxiang, Wang, Jing, Fu, Hongyuan, Tian, He, Liu, YongjunVolume:
9525
Year:
2015
Language:
english
DOI:
10.1117/12.2184590
File:
PDF, 514 KB
english, 2015