SPIE Proceedings [SPIE Photonics China '96 - Beijing, China (Monday 4 November 1996)] Automated Optical Inspection for Industry - Comprehensive test of low-level-light image intensifiers
Liu, Yu, Ma, Yueqin, Jiang, Junyan, Shi, Jifang, Wu, Frederick Y., Ye, ShenghuaVolume:
2899
Year:
1996
Language:
english
DOI:
10.1117/12.253086
File:
PDF, 474 KB
english, 1996