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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Fourth Generation X-Ray Sources and Optics II - FEL beam metrology with a gas-monitor detector
Gottwald, Alexander, Bobashev, SergeJ V., Hahn, Ulrich, Hoehl, Arne, Jastrow, Ulf, Richter, Mathias, Sorokin, Andrej A., Tiedtke, Kai I., Biedron, Sandra G., Eberhardt, Wolfgang, Ishikawa, Tetsuya, TaVolume:
5534
Year:
2004
Language:
english
DOI:
10.1117/12.556289
File:
PDF, 306 KB
english, 2004