Impact of two-step-recessed gate structure on RF performance of InP-based HEMTs
Suemitsu, T., Enoki, T., Yokoyama, H., Umeda, Y., Ishii, Y.Volume:
34
Year:
1998
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19980166
File:
PDF, 492 KB
english, 1998