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Comparative study of silicon detectors
Allier, C.P., Valk, H., Huizenga, J., Bom, V.R., Hollander, R.W., Van Eijk, C.W.E.Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.682451
Date:
June, 1998
File:
PDF, 533 KB
english, 1998