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[ACM Press the 43rd annual conference - San Francisco, CA, USA (2006.07.24-2006.07.28)] Proceedings of the 43rd annual conference on Design automation - DAC '06 - Unknown-tolerance analysis and test-quality control for test response compaction using space compactors
Chao, Mango C.-T., Cheng, Kwang-Ting, Wang, Seongmoon, Chakradhar, Srimat, Wei, Wen-LongYear:
2006
Language:
english
DOI:
10.1145/1146909.1147183
File:
PDF, 609 KB
english, 2006