SPIE Proceedings [SPIE Shanghai - DL tentative - Shanghai, China (Monday 1 April 1991)] International Conference on Thin Film Physics and Applications - X-ray evaluation on residual stresses in vapor-deposited hard coatings
Xu, Kewei, Chen, Jin, Gao, Runsheng, He, Jia W., Zhao, Cheng, Li, Shizhi, Zhou, Shixun, Wang, YonglingVolume:
1519
Year:
1991
Language:
english
DOI:
10.1117/12.47289
File:
PDF, 303 KB
english, 1991