![](/img/cover-not-exists.png)
Correlation between surface morphology and electrical properties of VO2 films grown by direct thermal oxidation method
Yoon, Joonseok, Park, Changwoo, Park, Sungkyun, Mun, Bongjin Simon, Ju, HonglyoulVolume:
353
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2015.07.036
Date:
October, 2015
File:
PDF, 1.82 MB
english, 2015