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[IEEE 2015 International Conference on Electrical, Electronics, Signals, Communication and Optimization (EESCO) - Visakhapatnam, India (2015.1.24-2015.1.25)] 2015 International Conference on Electrical, Electronics, Signals, Communication and Optimization (EESCO) - Measurement of length and width of betel leaf by image processing using MATLAB
Nayak, Dolly, Dey, Amar Kumar, Sharma, ManishaYear:
2015
Language:
english
DOI:
10.1109/EESCO.2015.7253754
File:
PDF, 278 KB
english, 2015