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[IEEE 2006 IEEE International Symposium on Industrial Electronics - Montreal, Que. (2006.07.9-2006.07.13)] 2006 IEEE International Symposium on Industrial Electronics - Parasitic Inductance Effects on the Switching Loss Measurement of Power Semiconductor Devices

Shen, Yanqun, Jiang, Jian, Xiong, Yan, Deng, Yan, He, Xiangning, Zeng, Zhaohui
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Year:
2006
Language:
english
DOI:
10.1109/ISIE.2006.295745
File:
PDF, 5.64 MB
english, 2006
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