SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, United States (Monday 20 April 2015)] Next-Generation Analyst III - Intelligence Reach for Expertise (IREx)
Broome, Barbara D., Hanratty, Timothy P., Hall, David L., Llinas, James, Hadley, Christina, Schoening, James R., Schreiber, YonatanVolume:
9499
Year:
2015
Language:
english
DOI:
10.1117/12.2182096
File:
PDF, 189 KB
english, 2015