SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, United States (Monday 20 April 2015)] Next-Generation Analyst III - Addressing information management and dissemination challenges for the next generation analyst
Broome, Barbara D., Hanratty, Timothy P., Hall, David L., Llinas, James, Kovach, Jesse, Sadler, Laurel, Suri, Niranjan, Winkler, RobertVolume:
9499
Year:
2015
Language:
english
DOI:
10.1117/12.2184176
File:
PDF, 742 KB
english, 2015