SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, United States (Monday 20 April 2015)] Next-Generation Analyst III - Composable Analytic Systems for next-generation intelligence analysis
Broome, Barbara D., Hanratty, Timothy P., Hall, David L., Llinas, James, DiBona, Phil, Llinas, James, Barry, KevinVolume:
9499
Year:
2015
Language:
english
DOI:
10.1117/12.2184177
File:
PDF, 1.22 MB
english, 2015