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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] X-Ray Nanoimaging: Instruments and Methods II - Progress on multi-order hard x-ray imaging with multilayer zone plates
Lai, Barry, Osterhoff, Markus, Döring, Florian, Eberl, Christian, Wilke, Robin, Wallentin, Jesper, Krebs, Hans-Ulrich, Sprung, Michael, Salditt, TimVolume:
9592
Year:
2015
Language:
english
DOI:
10.1117/12.2187799
File:
PDF, 1.50 MB
english, 2015