SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 9 August 2015)] X-Ray Nanoimaging: Instruments and Methods II - X-ray microscopy for in situ characterization of 3D nanostructural evolution in the laboratory
Lai, Barry, Hornberger, Benjamin, Bale, Hrishikesh, Merkle, Arno, Feser, Michael, Harris, William, Etchin, Sergey, Leibowitz, Marty, Qiu, Wei, Tkachuk, Andrei, Gu, Allen, Bradley, Robert S., Lu, XuekuVolume:
9592
Year:
2015
Language:
english
DOI:
10.1117/12.2188728
File:
PDF, 1.44 MB
english, 2015