SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Hybrid phase retrieval algorithm for solving the twin image problem in in-line digital holography
Zhao, Jie, Wang, Dayong, Zhang, Fucai, Wang, Yunxin, Zhang, Yudong, Sasián, José, Xiang, Libin, To, SandyVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.865530
File:
PDF, 893 KB
english, 2010