An ellipsometric method for determining the optical...

Optics and Spectroscopy 2015 / 8 Vol. 119; Iss. 2

An ellipsometric method for determining the optical parameters of thin-film coatings with a complex structure

Tikhii, A. A., Gritskikh, V. A., Kara-Murza, S. V., Korchikova, N. V., Nikolaenko, Yu. M., Faraponov, V. V., Zhikharev, I. V.
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Volume:
119
Language:
english
Journal:
Optics and Spectroscopy
DOI:
10.1134/s0030400x15080238
Date:
August, 2015
File:
PDF, 686 KB
english, 2015
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