Polarimetric characterization of bismuth thin films...

Applied Optics 2012 / 12 Vol. 51; Iss. 36

Polarimetric characterization of bismuth thin films deposited by laser ablation

Espinosa-Luna, Rafael, Camps, Enrique, Cardona, Dagoberto, De la Rosa, Elder
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Volume:
51
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.51.008549
Date:
December, 2012
File:
PDF, 474 KB
english, 2012
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