Performance of bent-crystal x-ray microscopes for high...

Performance of bent-crystal x-ray microscopes for high energy density physics research

Schollmeier, Marius S., Geissel, Matthias, Shores, Jonathon E., Smith, Ian C., Porter, John L.
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Volume:
54
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.54.005147
Date:
June, 2015
File:
PDF, 1.73 MB
english, 2015
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