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Spectral-phase interferometry for direct electric-field reconstruction applied to seeded extreme-ultraviolet free-electron lasers
Mahieu, Benoît, Gauthier, David, De Ninno, Giovanni, Dacasa, Hugo, Lozano, Magali, Rousseau, Jean-Philippe, Zeitoun, Philippe, Garzella, David, Merdji, HamedVolume:
23
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.23.017665
Date:
July, 2015
File:
PDF, 886 KB
english, 2015