Generalized data reduction approach for aspheric testing in...

Applied Optics 2012 / 04 Vol. 51; Iss. 10

Generalized data reduction approach for aspheric testing in a non-null interferometer

Tian, Chao, Yang, Yongying, Zhuo, Yongmo
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Volume:
51
Language:
english
Journal:
Applied Optics
DOI:
10.1364/ao.51.001598
Date:
April, 2012
File:
PDF, 921 KB
english, 2012
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